4 results
In-Plane Magnetic Field Evaluation with 0.47-nm Resolution by Aberration-Corrected 1.2-MV Holography Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 54-55
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Sub-Nanometer-Resolution Magnetic Field Observation Using Aberration-Corrected 1.2-MV Holography Electron Microscope with Pulse Magnetization System
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 452-453
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Development of Pulse Magnetization System on Aberration Corrected 1.2-MV Cold Field-Emission Transmission Electron Microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1702-1703
- Print publication:
- July 2016
-
- Article
-
- You have access
- Export citation
Elastic constants and microcracks in YBa2Cu3O7
-
- Journal:
- Journal of Materials Research / Volume 10 / Issue 1 / January 1995
- Published online by Cambridge University Press:
- 03 March 2011, pp. 7-10
- Print publication:
- January 1995
-
- Article
- Export citation